Abstract
The dependence of the work function on Cs coverage of clean polycrystalline Be has been measured. The maximum shift obtainable is 2.3 eV. Photoemission and thick Cs overlayer measurements indicate that the minimum work function surface is at 1.6 eV. This new measurement is one of many showing that cesium covered metals and semiconductors are observed to have a minimum work function close to 1.6 eV. In general the minimum work function value is observed to be weakly dependent on the substrate. The work function is determined by the polarization of the Cs overlayer with the increase of electronic charge in the Cs-substrate interface.
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