Wide angle X-ray scattering and atomic force microscopy studies of amorphous In–Se films

Abstract

Amorphous In–Se films, containing 60 and 66 at.% Se have been studied by wide angle X-ray scattering and atomic force microscopy. The experimental radial distribution functions have been compared with model simulations based on the crystalline InSe structure. A comparison shows that the InSe crystal based model, in which atoms are arranged in the layered structure, accounts very well for the experimental data. The wide angle X-ray scattering data are related to the atomic force microscopy observations, which provide evidence that the investigated amorphous films exhibit planar surface morphology on the nanoscopic level.