Abstract
Abstract Wide angle X-ray diffraction technique was used to characterize a series of post-neck drawn high density polyethylene filaments which were stretched by a two-stage drawing process. The first stage of this drawing process utilizes 100%/min draw rate until the natural draw ratio of 8–10 × ist attained. In the second stage, the fully necked filament is re-clamped and further stretched at lower stretch rate (1%/min) upto the desired stretch ratio. Wide angle X-ray diffraction data were analyzed using the Warren-Averbach fourier technique. This analysis showed that number average crystallite size increase with increasing draw ratio. In addition, the root mean square strains (∊2)½ in the crystals decreased with increasing draw ratio upto the draw ratio of 25 then showed an increase with further increase of draw ratio.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
