Abstract
We present a technique for rapid characterization of degenerate nonlinear absorption and refraction spectra using a femtosecond white-light continuum (WLC) pulse to perform Z-scans. The spectral components of the WLC source are temporally and spatially dispersed to minimize nondegenerate two-photon absorption (2PA) processes. We demonstrate the validity of the method by measuring the 2PA spectrum of a well-characterized semiconductor, ZnSe.
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