Abstract
We demonstrated measurement of carrier-envelope phase (CEP) changes of amplified laser pulses by utilizing spectral interferometry between the white-light continuum and its second harmonic. The white-light continuum was generated by self-phase modulation (SPM) in a gas-filled hollow fiber. This method enables us to measure the CEP changes of low-repetition rate laser pulses on a shot-to-shot basis. The CEP-change of the amplified laser pulses exhibits random distribution that is mainly due to the CEP change fluctuation of the seed pulses from a carrier-envelope-offset (CEO) uncontrolled oscillator. We also demonstrated the CEO measurement of a mode-locked Ti:Sapphire oscillator. We utilized the self-referencing method, which measures the temporal beat frequency between the white-light continuum and its second harmonic. The white-light continuum was generated by the SPM in a micro-structure fiber. The temporal evolution of the beat signal showed CEO fluctuation of the uncontrolled oscillator.
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