Abstract
Experimental investigation of low frequency (10 Hz-2 MHz) noise characteristics of different diode structures: Schottky contacts, pn-junctions, and tunnel diodes have been carried out in wide temperature range (77-336 K) in order to verify which one-shot noise or thermal noise in nonlinear resistance - concept of white noise better explains the experimental results. The experimental results have shown that white noise spectra of voltage fluctuations of pn-junction and Schottky diodes with exponential current-voltage characteristic are well described by Gupta formula with ideal and non-ideal current-voltage characteristics. Shot noise is well described by Schottky formula only in the case of ideal current-voltage characteristics. To describe the tunnel diode white noise spectra one needs to include thermal noise of differential resistance of a diode and tunneling shot noise components.
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