Abstract

Cell-aware faults have previously been proposed to more effectively detect defects within gates. At the same time, n-detect test sets that provide multiple detections of each stuck-at fault are often used to maximize the detection of unmodeled defects. However, n-detect test sets are often not particularly effective at fortuitously detecting all untargeted cell-aware faults. In this paper, we investigate the effectiveness of different types of n-detect ATPG test sets for efficiently detecting difficult cell-aware-type faults and explain why optimizing test sets for n- detect using stuck-at faults while still keeping pattern counts low can actually bias those test sets against the detection of some cell-aware type faults. We then investigate the addition of cell-aware top-off patterns for cell-aware-type faults that are shown to be functionally relevant through good state simulation, allowing such faults to be prioritized when testing resources are limited.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call