Abstract
Wheat Leaf Rust Detection at an Early Stage with Atomic Force Microscopy (AFM)
Highlights
In recent decades, there has been impressive growth in food production worldwide, which have been attributed to the development of improved, disease-resistant varieties, increased use of chemical fertilizers and pesticides
The Atomic Force Microscopy (AFM) system installed at National Institute of lasers and Optronics (NILOP) used to analyze the fresh sample taken from field in 1 to 2 hours
Wheat leaf rust samples collection and examination of signs and symptoms in the field is very essential before AFM test
Summary
There has been impressive growth in food production worldwide, which have been attributed to the development of improved, disease-resistant varieties, increased use of chemical fertilizers and pesticides. During the period 1995 to 2050, the world’s population is projected to increase by 75 percent and food security projected to become more critical, increasing wheat yield potential in the developing world remains a high priority [4]. Among the other fungal and viral infections, wheat leaf rust caused by viral fungus continue to pose a major threat to wheat production over large areas, in Asia. Rust diseases significantly influence several crop species and considerable research focuses on understanding the basis of host specificity and resistance. Rust fungi vary considerably in the number of hosts they can infect, such as wheat leaf rust (Puccinia triticina), which can only infect species in the genera Triticum and Aegilops. Rusts are common on grains and grasses [5,6,7]
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