Abstract
The spectral reflectance of a cropped surface changes as the plant develops. An indicator of crop growth is leaf area index (ratio of green leaf area to soil area). The leaf area index, disease severity, and yield were determined for several winter wheat fields in Kansas during the 1973 growing season. Multispectral scanner (MSS) data from Earth Resources Technology Satellite-1 (ERTS-1) showed a high correlation ( r ⩾ 0.90) between crop growth and MSS4/MSS5, and crop growth and MSS5/MSS6. Wheat disease severity and yields were significantly correlated at the 5% level with MSS4/MSS6 and with MSS4/MSS7. Further investigation is required before ERTS imagery can be routinely used detecting and estimating disease severity and yield reduction.
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