Abstract
In 1985 Nichols and Ryon [1] first demonstrated their x-ray microfluorescence analysis (XRMF) system. By 1986 Nichols et al. [2] Boehme [3] and Gurker [4] provided us with spectacular photographs of x-ray images of geological materials, wire grids, and semiconductor chip carriers. During the delivery of the paper by Nichols et al. [2] the present author realized that a higher degree of spatial resolution could be accomplished by analysis of the raw data.
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