Abstract
In this paper, we present a general investigation of the effective potential for complete wetting on self-affine rough surfaces. The roughness effect is investigated by means of the height-height correlation model in Fourier space ~(1+aξ^2q^2)^–1–H. The parameters H and ξ are, respectively, the roughness exponent and the substrate in-plane correlation length. It is observed that the effect of H on the free interface profile is significant for ξ < Y (Y is a “healing” length), and becomes negligible for wetting-layer thickness larger than a characteristic thickness τ~ξ^u for long-range substrate forces. Finally, the large Y (Y»ξ) regime is characterized by a power-law scaling ~Y^–2.
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