Abstract
The surface impedance of melt-processed thick films of YBa2Cu3O7−x on yttria-stabilized zirconia substrates has been measured as a function of temperature over the frequency range 9–18 GHz using an endwall replacement technique. The temperature dependence of both the penetration depth and the surface resistance of thisp-type cuprate system can be described within a two-gap weak-link model. The surface resistance scaled to 10 GHz by the observedf2 frequency dependence gives a value of 1.8 mΩ at 77 K, which compares favorably with the lowest reported values for thick films of this material at microwave frequencies. Trends in material processing indicate that increasing the grain size would further decrease the surface resistance at microwave frequencies.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
