Abstract
A new method for identifying structural defect-induced vibration signals was developed based on the analytic wavelet transform. The advantage of this method is that it extracts a defect-related impulse signal and constructs its envelope in a single step, eliminating the need for intermediate operations. Theoretical background of the analytic wavelet transform is studied. Analysis of numerically simulated and experimental vibration signals have confirmed that the developed method can successfully detect the small defect-induced impulses that are buried in the main vibration and noise signals
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