Abstract
Higher harmonics have been widely used to characterize nanomechanical properties of the sample surface in tapping mode atomic force microscopy. They are usually analyzed by the Fourier transform method which provides time-averaged amplitude and phase information. In this paper, we apply the analytic wavelet transform to analyze higher harmonics. The intuitive descriptions of higher harmonics are obtained by the time-frequency analysis of the tip motion signal. The temporal evolutions of the higher harmonics are analyzed. The higher harmonics extracted by the analytic wavelet transform are closely related to the wavelet parameters. Different time and frequency features of higher harmonics can be analyzed through adjusting the wavelet parameters. Moreover, the root-mean-square amplitude and the peak amplitude obtained by the analytic wavelet transform can provide better characterization of sample properties than the amplitude obtained by the Fourier transform method.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
