Abstract
In this paper, the optical and the structural properties of a wavelength-selective polarizer made of narrow band pass lters (NBPFs) are presented. Anisotropic spacer layers were deposited in the NBPFs by using electron beam evaporation with a glancing angle deposition (GLAD) technique while mirror layers were deposited by a conventional evaporation method. TiO2, Ta2O5 and ZrO2 lms deposited by the GLAD technique at various oblique incident angles were investigated to select the right material for the spacer layer. The e ects of TiO2 spacer layers with tilted, zigzag and helical structures on the wavelength-selective polarizer were also investigated. It is found that the maximum transmittance peak of the wavelength-selective polarizer with TiO2 zigzag spacer deposited by the GLAD technique is separated by 6 nm due to its birefringence.
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