Abstract
High lateral density quantum dot (QD) structures are self-formed by growing GaAs∕InAs short-period superlattices (SLs) on InP (411)A substrates by gas source molecular beam epitaxy. Multilayer QD structures sandwiched with InP barrier layers showed a strong photoluminescence emission. The 1.3–1.6μm wavelength emission was easily obtained and precisely controlled by regulating the SL period as well as the number of InAs monolayers (layer thickness). This wavelength control can be understood by considering the carrier confinement along the growth direction as well as the effective well depth change.
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