Wafer-Level Testable High-Speed Silicon Microring Modulator Integrated with Grating Couplers

Abstract

A wafer-level testable silicon-on-insulator-based microring modulator is demonstrated with high modulation speed, to which the grating couplers are integrated as the fiber-to-chip interfaces. Cost-efficient fabrications are realized with the help of optical structure and etching depth designs. Grating couplers and waveguides are patterned and etched together with the same slab thickness. Finally we obtain a 3-dB coupling bandwidth of about 60 nm and 10 Gb/s nonreturn-to-zero modulation by wafer-level optical and electrical measurements.