Abstract
Personal wireless communication is one of the fastest growing fields in the communications industry. The technology employed by mobile telecommunications is rapidly growing with shorter product life cycles, a shortening of time to market expectations, and a higher customer expectation of more capability for less cost. In mobile phone manufacturing, the radio frequency (RF) functional test process needs more operation time than other processes. Manufacturers require an effective method to reduce the RF test items so that the inspection time can decrease, but still the quality of the RF functional test must be maintained. The Variable Precision Rough Sets (VPRS) model is a powerful tool for data mining, as it has been widely applied to acquire knowledge. In this study the VPRS model is employed to reduce the RF test items in mobile phone manufacturing. Implementation results show that the test items have been significantly reduced. By using these remaining test items, the inspection accuracy is very close to that of the original test procedure. In addition, VPRS demonstrates a better performance than that of the decision tree approach.
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