Abstract
Starting from microscopic theory of the Josephson tunnel junctions, the general expression for the power spectrum of small voltage fluctuations S V(ω) is obtained. According to this expression, S V(ω) could be considered as a result of parametric conversion of “original fluctuations” at composite frequencies ω n= ω+n ω v ( ω v = 2 e V h ̵ is the Josephson frequency) to the observation frequency ω. The low-frequency spectral density S V(o) of voltage fluctuations is numerically calculated as a function of dc voltage V for the case of relatively small junction capacitance (β⪡1). This dependence is compared with the results obtained for generalized RSJ model and for normal tunnel junction.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Physica B+C
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
