Abstract
Starting from microscopic theory of the Josephson tunnel junctions, the general expression for the power spectrum of small voltage fluctuations S V(ω) is obtained. According to this expression, S V(ω) could be considered as a result of parametric conversion of “original fluctuations” at composite frequencies ω n= ω+n ω v ( ω v = 2 e V h ̵ is the Josephson frequency) to the observation frequency ω. The low-frequency spectral density S V(o) of voltage fluctuations is numerically calculated as a function of dc voltage V for the case of relatively small junction capacitance (β⪡1). This dependence is compared with the results obtained for generalized RSJ model and for normal tunnel junction.
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