Voltage dependent STM imaging of inorganic adsorbates

Abstract

Scanning tunneling microscopy is sensitive to surface adsorbates to a much lower impurity level than most other surface science techniques. Even under the best vacuum and preparation conditions, a very low concentration of depressions of unknown origin is often observed in STM images of the coin metal surfaces. We outline a procedure to identify impurities by apparent height spectroscopy; a technique that can be easily performed by standard scanning tunneling microscopes. Apparent height spectroscopy, performed with a low-temperature scanning tunneling microscope, records the apparent height of an adsorbate with respect to the surface level over an extended voltage range at distinct voltage intervals. The spectra show characteristic features that can be used to identify adsorbates. We exemplify our method for two common impurities on Cu(111), oxygen atoms and carbon monoxide molecules. We reveal three characteristic differences in the apparent height spectroscopy of the two adsorbates: the dark region, the voltage of contrast reversal, and the onset of the lowest unoccupied molecular orbital. Each of these features is characteristic for the specific adsorbate/substrate system; giving three possibilities to identify the two species. The procedure can easily be extended to other impurities.