Abstract
Most important problems in modern photonics are fabrication, visualization and characterization of nanomaterials at optical frequencies. A number of optical techniques uses tightly focused laser beams to access longitudinal electromagnetic fields, which are directed towards the wave vector. In this Letter, the distribution of transverse and longitudinal optical fields in tightly focused laser beams, polarized in a new fashion, is investigated. Polarization dependent fingerprints of transverse and longitudinal optical fields are experimentally captured by means of photoinduced surface deformations in azobenzene polymer thin films.
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