Abstract
The antiferromagnetic T-domain structures on a bulk NiO crystal surface could be visualized by means of incident-light types of microscope such as a differential interference microscope, a phase-contrast microscope and a high-dispersion interference contrast method. The visualization of the antiferromagnetic domain is possible due to the facial tilt which was induced in the NiO crystal due to the antiferromagnetic ordering below the Neel temperature. The lateral resolution of the present methods in visualization of the domain structure is about 1μm, which is better than that of X-ray or neutron topography. The tilt angle between each domain was measured by two-beam interferometry; the average experimental value (9′23″) agrees fairly well with the calculated value (8′24″). Direct observation of the movement and disappearance of the domain boundaries upon heating could also be carried out under the phase-contrast microscope.
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