Abstract
An oscillating-cup viscometer was developed to measure viscosity of molten HgZnTe ternary semiconductor alloys. Data were collected for the pseudobinary Hg0.84Zn0.16Te melt between 770 and 850 °C. The kinematic viscosity was found to vary from approximately 1.1 to 1.4×10−3 cm2 s−1. A slow relaxation phenomena was also observed for temperatures from the melting point of 770 to ∼800 °C. Possible mechanisms for this effect are discussed.
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