Abstract

ABSTRACT The crack propagation behavior of unfilled and filled styrene–butadiene rubber (SBR) in steady and dynamic tearing was investigated using tensile tests on trousers samples and tear fatigue measurements on single edge notched tension (SENT) samples, respectively. For the unfilled sample, both types of measurements indicated that the tearing energy is dominated by the viscoelastic response of the polymer. This was demonstrated by the creation of crack growth master curves using the horizontal shift factors obtained from mastering the complex modulus. The tearing energy increased with increasing crack velocity and decreasing temperature as required by the time-temperature superposition principle. The crack growth master curves followed a power law with the same exponent for steady and dynamic tearing. This exponent agrees fairly well with the exponent predicted by linear viscoelastic crack propagation theory. For steady tearing at high crack propagation rates, systematic deviations from the master curves appeared, which were attributed to flash temperature effects. For the filled SBR, which contained 50 phr carbon black, only dynamic tearing was found to be dominated by the viscoelastic response of the polymer. For steady tearing, filler networking seemed to alter crack propagation rates significantly, so that the viscoelastic fingerprint was no longer visible. For the filled sample, additional measurements with a high preload were conducted. It was demonstrated that a single master curve can be constructed, only if the (static) preload contribution is neglected and the dynamic contribution of the energy density is used for the evaluation of the tearing energy. This master curve showed two distinct slopes at high and low crack velocities. It is argued that the higher slope at low crack speeds is relevant for lifetime predictions based on the integration of the Paris–Erdogan power law. Under conditions in which the viscoelastic crack propagation holds, very slow crack growth rates can be explored at reasonable testing times by measurements at elevated temperatures.

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