Abstract

Deep learning is a new direction of research for specific emitter identification (SEI). Radio frequency (RF) fingerprints of the emitter signal are small and sensitive to noise. It is difficult to assign labels containing category information in noncooperative communication scenarios. This makes network models obtained by conventional supervised learning methods perform unsatisfactorily, leading to poor identification performance. To address this limitation, this paper proposes a semisupervised SEI algorithm based on bispectrum analysis and virtual adversarial training (VAT). Bispectrum analysis is performed on RF signals to enhance individual discriminability. A convolutional neural network (CNN) is used for RF fingerprint extraction. We used a small amount of labelled data to train the CNN in an adversarial manner to improve the antinoise performance of the network in a supervised model. Virtual adversarial samples were calculated for VAT, which made full use of labelled and large unlabelled training data to further improve the generalization capability of the network. Results of numerical experiments on a set of six universal software radio peripheral (USRP; model B210) devices demonstrated the stable and fast convergence performance of the proposed method, which exhibited approximately 90% classification accuracy at 10 dB. Finally, the classification performance of our method was verified using other evaluation metrics including receiver operating characteristic and precision-recall.

Highlights

  • Specific emitter identification (SEI) refers to the technology used to identify individual emitters using distinctive external features of the signal called the radio frequency (RF) fingerprints [1]

  • We propose a semisupervised SEI scheme based on bispectrum analysis and virtual adversarial training (VAT)

  • We first collected RF signal data with an signal to noise ratio (SNR) of 10 dB from six universal software radio peripheral (USRP), with each device representing a class of signal

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Summary

Introduction

Specific emitter identification (SEI) refers to the technology used to identify individual emitters using distinctive external features of the signal called the radio frequency (RF) fingerprints [1]. Deep learning is used in SEI, which is a new research direction that can comprehensively and deeply extract the fingerprint features of the emitter signal through neural networks to improve recognition performance. Using a large number of unlabelled signal samples combined with a few labelled signal samples to conduct semisupervised SEI-based deep learning is a worthwhile research area To address this problem, we propose a semisupervised SEI scheme based on bispectrum analysis and virtual adversarial training (VAT). Bispectrum analysis, a signal preprocessing method, is used as the representation of RF fingerprints On this basis, we used the CNN to extract the RF fingerprints, and VAT is performed to fully utilize the labelled and large amount of unlabelled signal samples to conduct semisupervised SEI.

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