Abstract
Highly oriented poly( p-phenylene benzobisthiazole) films were stressed in a miniature hydraulic tensile tester interfaced to a fast scanning Fourier transform infra-red spectrometer. The changes in relative intensity, polarization, frequency and shape of infrared bands have been useful in the elucidation of microstructures. With the short time resolution achievable, vibrational bandshape and frequency have been shown to change at different rates when an external stress was applied.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
