Very thin CoCr films on titanium underlayers for high-density perpendicular recording computer discs

Abstract

Very thin CoCr films with and without a Ti underlayer were deposited on strengthened glass disk substrates by bias RF-sputtering. Perpendicular M-H loops were successfully measured by a polar Kerr M-O loop plotter. Very pronounced effects of the Ti underlayer and bias on the shearing of the loop and the perpendicular remanence ratio were observed. X-ray diffraction results show excellent