Abstract
Multilayer thin films based on iron oxide and chromium oxide are grown using pulsed laser deposition technique. Structural, electrical, and magnetic properties of the multilayer films are studied in detail. X-ray diffraction analysis shows the polycrystalline nature of chromium oxide films, while iron oxide shows strong orientation along (222) direction. Temperature dependent electrical measurements show semiconducting nature of the film. These multilayer films show magneto-resistance (MR) of about 1.4% at 1 T field. Zero field cool and field cool magnetization (M) vs. magnetic field (H) studies clearly show the presence of vertical exchange bias effect. This vertical exchange bias effect decreases with increase in temperature and vanishes at room temperature.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
