Abstract
High resolution x-ray diffraction based reciprocal space mapping is employed to investigate vertical correlation in submonolayer Zn(Cd)Te/ZnCdSe type-II quantum dots (QDs). The average lateral deviation from one dot to another is found to decrease from 13%–17% to 8%–11% with an increase in QD size. Narrower photoluminescence with a better yield is obtained for the sample with improved vertical correlation, indicating smaller QD size distribution along with partial suppression of non-radiative recombination paths. Observed reduction in radiative lifetimes and supportive calculations demonstrate enhanced hole-hole wavefunction overlap pointing towards possibility of miniband formation, an advantageous feature for an intermediate band solar cell.
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