Abstract
We have developed a UHV system for in situ studies of magnetic domains and magnetization reversal of thin films in the presence of external magnetic fields and at variable temperature. The system comprises a setup for magneto-optical Kerr effect measurements of magnetization curves, a Kerr-microscope for far-field magnetic-domain imaging, and a magneto-optical scanning near-field microscope in combination with a Sagnac interferometer (Sagnac-SNOM) for high-resolution imaging on a sub-μm scale. All components have successfully been tested, and the feasibility of studying ultrathin films has been demonstrated.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
