Abstract
We have developed a UHV system for in situ studies of magnetic domains and magnetization reversal of thin films in the presence of external magnetic fields and at variable temperature. The system comprises a setup for magneto-optical Kerr effect measurements of magnetization curves, a Kerr-microscope for far-field magnetic-domain imaging, and a magneto-optical scanning near-field microscope in combination with a Sagnac interferometer (Sagnac-SNOM) for high-resolution imaging on a sub-μm scale. All components have successfully been tested, and the feasibility of studying ultrathin films has been demonstrated.
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