Year-end Sale % OFF 
Abstract
Accurate measurements are presented of the thickness of helium films on cleaved surfaces of alkaline-earth fluoride crystals at 1.38 $^{\mathrm{o}}\mathrm{K}$. The films were measured between 10 and 250 \AA{} using an acoustic interferometry technique. The data are in excellent agreement with calculations based on the Lifshitz theory of van der Waals forces. Calculations of the film thickness on a variety of other substrates are also given.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
