Abstract
In this work, the capability of circuit simulation to predict CDM robustness of integrated circuits and to determine weak circuit elements is studied. The applicability is demonstrated for an ESD evaluation circuit designed to enable the analysis and optimization of ESD protection strategies in an early design phase during the introduction of a new technology. CDM circuit simulation is compared to the measurement results of variations of this circuit in two different package types. Failure locations are verified with physical failure analysis. The failure locations and CDM failure levels were reproduced accurately with circuit simulation for all circuit and package variations.
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