Abstract
The characterization of integrated antennas is challenging as they usually do not provide a suitable direct interface for the measurement equipment. Adding a connector or using on-wafer probes to interconnect to the measurement system often results in a change in antenna characteristics and requires a separate prototype resulting in additional complexity and associated costs. In order to measure the input impedance and realized gain of an integrated antenna, a contactless characterization method (CCM) can be used. In this article, the CCM is applied to an open-ended waveguide (OEWG). The OEWG operates in the $K_{a}$ -band and has a gain similar to typical integrated antennas. A good match between the reference measurements and the CCM is achieved, making this method potentially useful for the characterization of integrated mm-wave antennas.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
