Abstract
A well-designed, quasi-optical spectrometer (transmissometer and reflectometer) driven by a HP N5244A Vector Network Analyzer is introduced for characterization of solid condensed materials such as silicon, Perspex and hexaferrite in the millimetre wave band. A brief note is made on quasi-optical transmissometry being adapted for study of soft condensed phase (biological) systems.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
