Abstract
This paper describes a novel nonlinear measurement instrument based on a vector and amplitude/phase corrected network analyzer with integrated pulse multi-envelope measurement capabilities. The instrument provides pulse envelope domain measurements at isolated fundamental and harmonic responses (10 MHz to 26.5 GHz) from a nonlinear device to a time domain resolution of less than 20 nanoseconds. The instrument allows one to analyze the dynamic envelope behavior of the device at the fundamental and harmonic responses. Measurement results illustrate nonlinear device long and short term memory behavior from active devices. The resulting measurement results may be used to generate nonlinear mathematical models taking into account long and short term memory effects.
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