VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment

Abstract

This paper proposes the method of using bias-free vertical-cavity surface-emitting lasers (VCSELs) for in-circuit monitoring and effects-diagnosis of digital electronic equipment undertaking HPEM susceptibility test. A circuit level model for typical single mode VCSEL and standard I/O buffer information specification model for I/O ports of digital ICs are built to simulate VCSEL's load effects to the digital IC from specific logic families, as well as VCSEL's light output. Simulation results show that VCSELs connected in parallel to IC's I/O ports can be lighted up and its light output can achieve remote status-monitoring of I/O ports’ states in real time, while its load effects to the I/O ports are light enough not to deteriorate its signal integrity or disturb the circuit's normal operation. An experiment is performed on commercial mini sized drone to validate this study and demonstrate this method's feasibility and advantages in equipment level HPEM susceptibility test.