Abstract
Electrical potential barriers are often observed in ZnO‐based ceramics. Earlier studies on ZnO photoconduction have shown that the narrow regions, where the sintered grains have grown together, control the resistance of the entire sample. In those regions, the surface/volume ratio is sufficiently high for the acceptor concentration (which occurs because of adsorbed oxygen) to exceed the donor concentration inside the ZnO grains. More recent works have shown that Schottky barriers result from interface states because of the chemisorbed oxygen ion at the ZnO‐ceramic grain boundaries. The work reported in this paper involves the relationship between the densification of the microstructure and the varistor performance of ZnO ceramics. The emphasis of densification percentage as an indicator of the degree of sintering shows the desirability of continuity across ZnO grain boundaries, without the presence of voids or films of second phases, in optimizing varistor behavior. The effect of oxygen partial pressure on the development of varistor microstructure and electrical properties, as well the kinetics of grain growth, during the sintering process have been determined and are discussed.
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