Variations of the induced anisotropy in a-CoZr(M) (M=Mo,Ta) films as a function of thickness and deposition parameters

Abstract

In amorphous CoZrM films the field induced uniaxial anisotropy K u exhibit singular properties if the effective deposition temperature is 300K: H k increases strongly with decreasing film thickness d for 25 nm<d<50 nit. K u is reduced by a thermomagnetic annealing, hut reconstructed spontaneously at 300 K. K u is a growth induced structural anisotropy, its comportment is strongly affected by the intrinsic free volume that is larger, thinner is the layer.