Abstract
We have studied the variation of the strain and the magnetic moment in epitaxial fct Ni(001) film structures using a combination of reflection high energy electron diffraction (RHEED) and x-ray magnetic circular dichroism. A 30 Å Cu/Ni step-wedge (30, 60, 90, and 150 Å)/600 Å Cu buffer/Si(001) structure has been used to study the Ni thickness-dependent strain and magnetic moment. A decreased magnetic moment with decreasing Ni thickness is observed. A 30 Å Cu/50 Å Ni/step-wedged (600, 1000, 1500, and 2000 Å) Cu buffer/Si(001) was used to vary the degree of strain as determined by in situ RHEED measurements in the same Ni film by varying the Cu buffer layer thickness. Our study shows a possible correlation between the magnetic moment and strain.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
