Abstract
The Kα/Kβ intensity ratios for Ti, V and Cr in halogen (F and Cl) compounds were investigated. Measurements were carried out at ten different energies in the 5.5-12.1 keV interval by using the secondary excitation method. K X-rays emitted by the samples were counted by a Si(Li) detector with a resolution of 160 eV at 5.9 keV. It was observed that the measured values are getting closer to the theoretical values with increasing excitation energy. Values obtained were compared with the theoretical ones for pure elements.
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