Variation of leakage current conduction mechanism by heat treatment in Bi-based lead-free piezoelectric ceramics

Abstract

The leakage current mechanism in the as-sintered and quenched 0.75BiFeO3–0.25BaTiO3 (0.75BF–0.25BT) ceramics is evaluated by the space-charge-limited current (SCLC), Poole–Frenkel (P–F) emission, Schottky (ST) emission, and Fowler–Nordheim (F–N) tunneling mechanism. The discrepancy observed in the optical dielectric constant of BF and BT between the reported value and the values calculated from the P–F and ST emission plots suggests that the P–F emission and ST emission mechanisms do not contribute to the leakage current behavior of the 0.75BF–0.25BT ceramics. Subsequently, F–N tunneling is observed under a high electric field in the as-sintered 0.75BF–0.25BT ceramics, whereas the direct tunneling effect is exhibited throughout the measured electric field in the quenched ceramics. The SCLC mechanism is dominant in both the as-sintered and quenched 0.75BF–0.25BT ceramics. A change from Ohmic conduction to trap-filled-limit conduction is observed with an increase in the applied electric field in the as-sintered ceramics, whereas the quenched ceramics only revealed Ohmic conduction over the entire range of the measured electric field. The different behaviors exhibited in the SCLC mechanism between the as-sintered and the quenched ceramics imply that the conduction mechanism can be controlled by heat treatment.