Abstract
Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
https://doi.org/10.1007/s10812-023-01637-0
Journal: Journal of Applied Spectroscopy | Publication Date: Nov 1, 2023 |
Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach
Join us for a 30 min session where you can share your feedback and ask us any queries you have