Abstract
This work examines a direct procedure, referred to as vapor pressure scanning (VPS), for assessing the composition of nonstoichiometric crystals and calculating the vapor composition from experimental vapor pressure data. A VP phase analysis procedure is proposed as a precision technique for determining the phase composition of samples. Single-phase samples can be prepared by an “equalization” method.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
