Abstract
AbstractAn update for 1989 is given for the VAMAS Surface Chemical Analysis Technical Working Party. The overall programme now has 26 projects targeted to solve key problems in the enabling base of AES, XPS, SIMS, SNMS and sputter depth profiling. Increased coordination of projects is leading to stronger project databases. Eleven of the projects have involved round robins, and details are provided of results where the analysis is complete and of project leaders where new participants are invited.
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