Abstract
AbstractCd1‐xZnxTc crystals of different composition (0 ⩽ x ⩽ 1) were grown by the vertical Bridgman method and by synthesis in Te excess. After careful surface preparation of crystal slices, their Zn:Cd ratios were ascertained by wavelength‐dispersive X‐ray spectroscopy (WDXS), and the lattice parameters of the same slice regions were measured by X‐ray diffractometry. The Vegard rule concerning the linear lattice‐parameter dependence on composition is – in contrast with earlier literature data – exactly valid within the limits of error (Δx ⩽ ±0.01 and Δa/a ⩽ 3.7. 10−4) and follows the equation a(x) = (0.64822 ‐ 0.03792x) nm. After annealing some slices at different temperatures and controlled partial pressure conditions in ordcr to find possible phase separations or cation ordering effects, neither the lattice parameters were changed nor additonal interferences were found. A published occurrence of a rhomhohedral phase could not be confirmed by means of powder diffraction analysis. The results are discussed in relation to own electron diffraction investigations and to EXAFS literature data.
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