Abstract
Adsorption of Sm thin layers on the Mo (2 1 1) face was investigated by using Auger electron spectroscopy (AES), low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), X-ray photoemission spectroscopy (XPS) and changes of the work function measurements (Δ ϕ). The layer growth mode and the valence change of Sm atoms were determined. The Sm layer growth mode is layer-by-layer, at least to 3 ML, followed by the crystallite growth. It was found out that for θ < 0.3 ML Sm atoms are adsorbed only in divalent state. At coverage about 0.5 ML the number of both trivalent and divalent atoms is comparable. At θ = 1 ML, 11% of Sm atoms are divalent, and 89% trivalent. The second layer is composed of only divalent atoms. The first two layers have different surface densities, namely 6.15 × 10 14 atoms/cm 2 for the first layer, and 5.56 × 10 14 atoms/cm 2 for the second. Divalent Sm atoms creating the second layer form islands with the p(3 × 1) structure observed by LEED and STM.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
