Valence Band Dispersion in Bi-Doped (Ga,Mn)As Epitaxial Layers

Abstract

The impact of incorporating Bi into (Ga,Mn)As layers on their electronic, band structure, magnetic, and structural properties has been studied. The low-temperature molecular beam epitaxy technique was employed to grow homogeneous (Ga,Mn)(Bi,As) layers with high structural perfection. Post-growth annealing treatment resulted in improved structural and magnetic properties, as well as an increase in the hole concentration in the layers. Modulation photoreflectance spectroscopy confirmed modifications to the valence and split-off band in the (Ga,Mn)(Bi,As) layers. The experimental results are consistent with the valence band model of hole-mediated ferromagnetism in the layers. The (Ga,Mn)(Bi,As) compound combines the properties of (Ga,Mn)As and Ga(Bi,As) ternary compounds, offering the possibility of tailoring the bandgap structure to the requirements of novel device functionalities for future spintronic and photonic applications.