Abstract
The emission of free and self-trapped excitons in solid Kr wasinvestigated using luminescence spectroscopy in the vacuumultraviolet region. The influence of the sample crystalstructure and Xe impurity on the shape and location of theself-trapped exciton band was observed directly using samplesgrown under different conditions from gases with various degreesof purity. For the first time, the luminescence spectra weremeasured for practically Xe-free solid Kr samples of highstructural quality.New high-resolution reflection spectra of solid Kr were measuredas well. Due to the good quality of the samples and excellentvacuum conditions, a new member of the exciton series (n = 5)was revealed. On the basis of high-resolution reflectionmeasurements, more accurate values of several parametersconcerning excitons in solid Kr were determined.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
