V1−xWxO2 thermochromic films for device applications

Abstract

V1−xWxO2 is known to be a reliable thermochromic material for multiple practical applications due to its insulator to metal transition temperature controlled by W dopping. In this paper, we present electrical and optical properties of V1−xWxO2 thin films synthesized by PLD technique. In this respect, the electrical resistance, the refractive index (n), and extinction coefficient (k) as a function of temperature from 25 to 80 °C and wavelength ranging from 500 to 3000 nm were obtained using conventional 4-probe resistance and ellipsometry methods. The direct and indirect bandgap values at different doping levels and temperatures have been calculated using n and k versus energy data and compared with thermally activated bandgap from electrical resistance. A decrease in direct and indirect bandgaps with temperature and wavelength was observed with doping and temperature. Comparison between thermal and optical bandgap demonstrates that activated thermal bandgap is only comparable with the lowest optical indirect bandgap.Graphical abstract