Abstract
The Advanced Photon Source self-amplified spontaneous emission (SASE) free-electron laser (FEL) uses diagnostics between undulator sections to characterize the light and the electron beam. These diagnostics enable z-dependent measurements of the exponential growth of the radiation and of the microbunching. The original diagnostics were designed for visible light. To enable measurements down to 265 nm, UV-enhanced cameras and fused-silica lenses have been installed. We have now designed a diagnostics suite that will enable us to continue measurements down to 50 nm using reflective optics and back-illuminated CCD cameras operating in vacuum. We describe the enhancements to the diagnostics for operation in the UV and VUV.
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